Productinformatie

Partector TEM Sampler

The Partector TEM Sampler from Naneos is a compact instrument that combines the technology of a Naneos Partector with an electrostatic particle collector, in order to deposit nanoparticles directly onto a TEM grid for analysis. The result: a straightforward research instrument for effectively tracing sources of nanoparticles in the workplace and then depositing them directly for examination under a Transmission Electron Microscope (TEM). 

The Partector TEM Sampler automatically determines the
optimal sampling time and stops sampling when saturation of the TEM grid has been reached.  Measurement data is shown on a graphical display and is also stored on an SD card. 

Key features

• LDSA measurement with a time resolution of 1 second
  
  
• Wide concentration range, from 1-20,000 µm²/cm³
• Wide particle size range, from 10 nm to 10 µm
  
  
• Electrostatic deposition of particles onto standard 3.05 mm TEM grids
• Flow rate: 0.45 lpm
  
  
• Data storage on a µSD card (enough space for many years of data!)
  
  
• High concentration alarm with adjustable threshold